Record number :
2157453
Title of article :
Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures
Author/Authors :
Arenal، نويسنده , , R. and de la Peٌa، نويسنده , , F. and Stephan، نويسنده , , O. and Walls، نويسنده , , M. and Tencé، نويسنده , , M. and Loiseau، نويسنده , , Mohammad A. and Colliex، نويسنده , , C.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2008
Pages :
7
From page :
32
To page :
38
Abstract :
Multiple least squares fitting has been employed for long time in elemental electron energy-loss spectroscopy (EELS) analysis, in particular in biology, but with the hypothesis of a rather stable shape for the used core-loss signals. In the present case, we explore its use for identifying the variations in the edges’ fine structures in complex boron nitride samples and in particular for mapping the bonding types of boron in such samples. Details about this improved procedure applied to data acquired in the spectrum-imaging mode are reported here.
Keywords :
eels , Spectrum-imaging , MLS , Chemical bonding maps
Journal title :
Ultramicroscopy
Serial Year :
2008
Link To Document :
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