Record number :
2139866
Title of article :
Europium-doped sesquioxide thin films grown on sapphire by PLD
Author/Authors :
Bنr، نويسنده , , S and Huber، نويسنده , , G and Gonzalo، نويسنده , , J and Perea، نويسنده , , A and Climent، نويسنده , , A and Paszti، نويسنده , , F، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
4
From page :
30
To page :
33
Abstract :
This paper focuses on the preparation and characterization of crystalline thin films of rare-earth-doped sesquioxides (Y2O3, Lu2O3,and Sc2O3) grown by pulsed laser deposition (PLD) on single-crystal (0 0 0 1) sapphire substrates. X-ray diffraction (XRD) measurements show that the films with thicknesses between 1 and 500 nm were highly textured along the [1 1 1] direction. Using Rutherford backscattering (RBS) analysis the correct stoichiometric composition of the films could be proved. The emission and excitation spectra of the europium-doped films down to a thickness of 100 nm look similar to those of the corresponding crystalline bulk material, whereas films with 20 nm thickness and below show a completely different emission behavior.
Keywords :
Y2O3 thin films , pulsed laser deposition , XRD , RBS , Europium
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2003
Link To Document :
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