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Title of article :
Design and test of an integrated Sigma–Delta analog-to-digital converter for X-ray Computed Tomography
Author/Authors :
Bنumer، نويسنده , , Christian and Gnade، نويسنده , , Michael and Kemna، نويسنده , , Armin and Steadman، نويسنده , , Roger and Vogtmeier، نويسنده , , Gereon and Weiler، نويسنده , , Dirk، نويسنده ,
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Abstract :
Aiming at a compact, cost-effective data readout for X-ray CT, a monolithic approach is presented where photosensor and parts of the analog-to-digital converter are located on the same substrate. In a special realization of the ‘digital pixel’, a test array of photodiodes and in-pixel Sigma–Delta modulators has been developed and produced in a standard 0.8 μ m CMOS process. The single-bit, discrete-time modulator is of third order and has feedforward topology. Test samples have been characterized with emphasis on noise performance and linearity. An off-chip, decimation and low-pass filter has been designed according to the special requirements of CT. Signal processing with oversampling ADCs is compared to conventional solutions for data readout in X-ray CT.
Keywords :
X-ray computed tomography , CMOS sensor , ADC
Journal title :
Astroparticle Physics
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