Record number :
2012373
Title of article :
Sc–Si normal incidence mirrors for a VUV interval of 35–50 nm
Author/Authors :
Uspenskii، نويسنده , , Yu.A and Levashov، نويسنده , , V.E. and Vinogradov، نويسنده , , A.V and Fedorenko، نويسنده , , A.I and Kondratenko، نويسنده , , V.V and P.Pershin، نويسنده , , Yu and Zubarev، نويسنده , , E.N and Mrowka، نويسنده , , S and Schنfers، نويسنده , , F، نويسنده ,
Pages :
5
From page :
147
To page :
151
Abstract :
The Sc/Si multilayers are suggested as high-reflectivity coatings for a VUV interval of 35–50 nm. Fabricated mirrors show the normal incidence reflectivity of 30–50% which is high enough to effectively manipulate the beams of synchrotron radiation and compact discharge and laser-driven X-ray lasers. The obtained values are not, however, limiting for the Sc/Si coatings. Theoretical estimations as well as electron microscopy studies of Sc–Si interfaces indicate a large potential for further raising the reflectivity.
Keywords :
Vacuum ultraviolet , MIRROR , Multilayers
Journal title :
Astroparticle Physics
Link To Document :
بازگشت