Record number :
1411263
Title of article :
Investigation on the valence state of Te ions in the Bi6Ti5TeO22 thin film using X-ray photoelectron spectroscopy
Author/Authors :
Choi، نويسنده , , Chang-Hak and Choi، نويسنده , , Joo-Young and Cho، نويسنده , , Kyung-Hoon and Yoo، نويسنده , , Myong-Jae and Choi، نويسنده , , Jae-Hong and Nahm، نويسنده , , Sahn and Kang، نويسنده , , Chong-Yun and Yoon، نويسنده , , Seok Jin and Kim، نويسنده , , Jong-Hee، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
4
From page :
517
To page :
520
Abstract :
Bi6Ti5TeO22 (BTT) thin films were grown on a Pt/Ti/SiO2/Si(1 0 0) substrate under various conditions and the valence state of the Te ion was investigated. For the BTT films grown at 300 °C, most of the Te ions existed as Te4+ ions. However, for the 10 mol% Mn-added BTT films grown at 300 °C, Te6+ ions were found even in the film grown under low oxygen partial pressure (OPP) and their number increased with increasing OPP. This increase was attributed to the presence of Mn2+ ions, which assisted the transition of Te4+ ions to Te6+ ions in order to maintain the charge balance of the Ti4+ sites. Furthermore, in the films grown at 300 °C under a high OPP of 80.0 Pa and subsequently annealed at 600 °C under a high oxygen pressure of 101 kPa, most of the Te ions existed as Te6+ ions. However, for the film grown at 300 °C under low OPP, even though the film was annealed under a high oxygen pressure of 101 kPa, only a few of Te6+ ions were formed, whereas most of Te ions remained as the Te4+ ions.
Keywords :
X-ray photoelectron spectroscopy , Thin film , Bi6Ti5TeO22
Journal title :
Journal of the European Ceramic Society
Journal title :
Journal of the European Ceramic Society
Serial Year :
2010
Link To Document :
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