Record number :
1406757
Title of article :
Microwave dielectric characteristics of 0.75(Al1/2Ta1/2)O2–0.25(Ti1−xSnx)O2 ceramics
Author/Authors :
Choi، نويسنده , , Ji-Won and Ha، نويسنده , , Jong-Yoon and Yoon، نويسنده , , Seok Jin and Kim، نويسنده , , Hyun-Jai and Yoon، نويسنده , , Ki Hyun، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
4
From page :
2507
To page :
2510
Abstract :
The microwave dielectric characteristics of 0.75(Al1/2Ta1/2)O2–0.25(Ti1−xSnx)O2 ceramics were investigated. The microwave dielectric properties of 0.75(Al1/2Ta1/2)O2–0.25TiO2 sintered at 1450 °C exhibited a dielectric constant (ϵr) of 31.2, a Q·f0 of 54,590 GHz, and the temperature coefficient of resonant frequency (τf) of +12.8 ppm/°C. To control of the τf and enhance the Q·f0 for 0.75(Al1/2Ta1/2)O2–0.25TiO2, Sn4+ was substituted for Ti4+. With an increase of Sn content from 5 to 50 mol%, the εr slightly decreased, the Q·f0 increased and the τf shifted from positive to negative value. The τf within ±10 ppm/°C of zero was realized for the Sn content below 30 mol% and the microwave dielectric properties had the εr value of 31.2–26.3, the Q·f0 of 54,600–70,700 GHz, and τf of +12.8–−9.3 ppm/°C for this compositions. The relationship between microstructure and microwave dielectric characteristics was investigated.
Keywords :
Sn)O2 , (Ti , dielectric constant , Quality factor , Microwave ceramics , (Al , Ta)O2
Journal title :
Journal of the European Ceramic Society
Journal title :
Journal of the European Ceramic Society
Serial Year :
2003
Link To Document :
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