Author/Authors :
C.M Ramsdale، نويسنده , , I.C Bache، نويسنده , , J.D MacKenzie، نويسنده , , D.S Thomas، نويسنده , , A.C. Arias Cau، نويسنده , , A.M Donald، نويسنده , , R.H Friend، نويسنده , , N.C Greenham، نويسنده ,
Abstract :
We report the use of environmental scanning electron microscopy (ESEM) to determine the phase separation in the cross-section of a View the MathML source thick polyfluorene blend film, of the type used in polymer photovoltaic devices and LEDs. The micron and sub-micron surface phases are found to penetrate through the film to the underlying substrate, whilst smaller surface features do not necessarily propagate through the film. The observed cross-sectional structure helps to explain the optoelectronic response of these blends and shows that ESEM is an effective tool in the characterisation of polymer blend cross-sections.
Keywords :
ESEM , cross-section , Conjugated polymer , Organic devices , Solar cells
