Record number :
1009026
Title of article :
Electrical resistivity due to electron scattering with magnetic domain walls and magnetic properties of Ni–Fe alloy thin films
Author/Authors :
Y.C. Yeh، نويسنده , , C.W. Huang، نويسنده , , J.T. Lue، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
5
From page :
3420
To page :
3424
Abstract :
The physical properties of magnetic domain walls and electrical conductivity of permalloy thin films under external magnetic fields were studied. Using a magnetic force microscope (MFM), we observed the variation of domain configurations with the change of applied magnetic field for different film thicknesses of 245, 320, and 415 nm. A superconducting quantum interference device (SQUID) was exploited to measure the magnetization loop for the applied magnetic field either parallel or perpendicular to the normal direction of the surface. We also found that the resistivity increases significantly as the electrical current conduction changed from parallel to perpendicular to the domain walls.
Keywords :
Magnetization loop , CPW and CIW resistivities , Direct current and magnetic force microscopy
Journal title :
Applied Surface Science
Serial Year :
2008
Link To Document :
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