Record number :
1001008
Title of article :
Atomic-scale calculation of interface energy for Ag/Ni
Author/Authors :
Jian-Min Zhang*، نويسنده , , Hong Xin، نويسنده , , Xiu-Mei Wei، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
9
From page :
14
To page :
22
Abstract :
The energies of (0 0 1)Ag/(1 1 1)Ni, (0 1 1)Ag/(1 1 1)Ni and (1 1 1)Ag/(1 1 1)Ni twist boundaries have been calculated with modified analytical embedded atom method (MAEAM). The results show that the interface energies corresponding to (1 1 1)Ag/ (1 1 1)Ni, (0 0 1)Ag/(1 1 1)Ni and (0 1 1)Ag/(1 1 1)Ni increase successively and three lowest energies corresponding to twist angles u = 2.108, 158 and 28.938 for (1 1 1)Ag/(1 1 1)Ni, (0 0 1)Ag/(1 1 1)Ni and (0 1 1)Ag/(1 1 1)Ni are 272, 743.3 and 1094.3 mJ/m2, respectively. The epitaxial growth of Ag film on (1 1 1)Ni substrate driven solely by minimization of interface energy should result in the predominance of (1 1 1) grains, especially twist angle u = 2.108.
Keywords :
Interface energy , Calculation , MAEAM , Ag/Ni
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
2005
Link To Document :
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