Record number :
Title of article :
Deposition of PTFE thin films by RF plasma sputtering on h1 0 0i silicon substrates
Author/Authors :
Dhananjay S. Bodas، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
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Abstract :
Polymers have been studied extensively due to the wonderful array of properties presented by them. Polymer materials can be coated/deposited by various techniques like sputtering (magnetron, ion beam, RF or dc), plasma polymerization, etc. and can be used in coatings, paint industries, etc. The present study deals with the RF sputter deposition of poly(tetrafluoro ethylene) (PTFE), commonly known as Teflon. Depositions were carried out on mirror polished silicon h1 0 0i substrates at different powers in the range of 100–200 W. The deposition time was kept constant at 60 min. The sputtered film shows lower contact angle of 508 with water and 448 with diiodomethane, a lower interfacial tension value of 0.76 dyne/cm, indicating hydrophilicity and good adhesion of the film with the substrate. FTIR indicates presence of C–F, C–F2 bonding groups in the deposited film. Further, XPS study shows presence of CF3 (292.2 eV), CF2 (290.8 eV), C F (288.0 eV) and C–CF (286.4 eV) moieties indicating deposition of PTFE films at higher power levels of plasma
Keywords :
XPS , FTIR , Contact angle measurement , RF plasma sputtering , PTFE
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
Link To Document :