Record number :
Title of article :
Growth of SnO2 thin films on self-assembled layers of the short-chain alkoxysilane
Author/Authors :
Jin Li Zhang، نويسنده , , Wei Li*، نويسنده , , Yi Zhai، نويسنده , , Hong Yang، نويسنده , , Yiping Wang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
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Abstract :
The growth behavior and structure of self-assembled layers of short-chain alkoxysilane of 3-mercaptopropyltrimethoxysilane (MPS) on hydroxyl-terminated substrates were investigated using atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and contact angle measurements. It was indicated that the self-assembled layers of MPS formed island structures and deposited integrally on the substrates. Further, the deposition of SnO2 thin films on the MPS-coated substrates was studied using X-ray diffraction (XRD), AFM, XPS, and the high-resolution stylus profilometers. It was proved that uniform and compact SnO2 thin films indeed formed on the self-assembled layers of short-chain MPS. The as-deposited SnO2 films were cassiterite and showed the property of semiconductors, which would have wide applications in gas sensors, solar cells, catalysts, etc.
Keywords :
SnO2 , Alkoxysilane , self-assemble , thin films
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
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