Record number :
Title of article :
Quantitative surface analysis of plastic deformation of Pd electrodes in nanoscale
Author/Authors :
Ali Eftekhari، نويسنده , , Mahmood Kazemzad، نويسنده , , Mansoor Keyanpour-Rad، نويسنده , , Mohammad Ali Bahrevar، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
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Abstract :
Small-angle X-ray scattering (SAXS) was employed as a powerful technique for quantitative surface analysis of Pd electrodes subjected to severe plastic deformation. The experimental data obtained from SAXS measurements were analyzed by means of fractal geometry, as so-called fractal dimensions can be used as a quantitative measure of surface roughness. The influence of the strength of plastic deformation induced to the Pd/H system (due to phase transformation) on the degree of surface roughness was inspected. The powerfulness of this approach is ability for inspecting surface roughness in nanoscale. The surface fractality at nanoscale is significantly different from that at microscale.
Keywords :
Nanostructure , Plastic deformation , fractal , Nanoscale roughness , Pd electrode , SAXS
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
Link To Document :