Record number :
1000581
Title of article :
Determination of growth modes via spectroscopy: new simple analytical models
Author/Authors :
Qiang Fu، نويسنده , , Thomas Wagner، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
8
From page :
189
To page :
196
Abstract :
Analytical models for the determination of thin film growth modes were developed on the basis of the simultaneous multilayer (SM) growth model. The models take into account up-step and down-step diffusion, enabling quick identification of the growth modes from experimentally obtained spectroscopic data.We tested the models by applying them to growth data from the literature that had been recorded via Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and lowenergy ion scattering (LEIS). We discuss the applicability of the new analytical models in comparison with the diffusioncorrected simultaneous multilayer (DCSM) model
Keywords :
Film growth , Low energy ionscattering (LEIS) , Surface diffusion , growth model , Auger electron spectroscopy (AES) , X-ray photoelectron spectroscopy (XPS)
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
2005
Link To Document :
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