Record number :
1000576
Title of article :
The study of the influence of uniaxial stress on impurity complexes in silicon
Author/Authors :
G. Tessema ، نويسنده , , R. Vianden، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
9
From page :
146
To page :
154
Abstract :
The influence of external uniaxial stress on the different indium-donor complexes in silicon has been studied using the perturbed g –g angular correlation (PAC) method. Such effect of an applied stress is detected by means of the probe atoms situated at different complexes in the sample. The current results showed that the responses of the probes in an extrinsic silicon samples are found to be dissimilar for the same value of stress. Such change in the local environments of the probe atoms could be associated with the various strain field created by the implantations of varied size of impurities. The phosphorous implantation in silicon has even lead to the complete absence of observable effect of the applied stress suggesting significant lose of the elasticity of the sample.
Keywords :
Hyperfine interaction , Silicon , Uniaxial stress , Impurity defects
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
2005
Link To Document :
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