Record number :
100045
Title of article :
Practical considerations in applying (sigma)-(delta) modulation-based analog BIST to sampled-data systems
Author/Authors :
Wu، Cheng-Wen نويسنده , , Cheng، Kwang-Ting نويسنده , , Hong، Hao-Chiao نويسنده , , Huang، Jiun-Lang نويسنده , , Kwai، Ding-Ming نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-552
From page :
553
To page :
0
Abstract :
The analog built-in self-test (BIST) scheme, with stimulus generation and response extraction based on the (sigma)-(delta) modulation, is proven to be quite effective for sampled-data systems. We show that the (sigma)-(delta) modulators can be selected optimally for certain applications and functional tests. The criteria for valid tests are also derived. In particular, a valid frequency response test is determined by the frequency response observation range FROR/sub BIST/(z) of the BIST circuit. Given the transfer function H/sub CUT/(z) of the circuit under test, the requirement becomes FROR/sub BIST/(z)>|1/H/sub CUT/(z)|. Using the MOSIS 0.35-(mu)m CMOS process, we have implemented a test chip containing a Fleischer-Laker biquadratic low-pass filter as the circuit under test. An on-chip one-bit digital-to-analog converter provides the analog stimulus from a bit stream which is applied externally. For each test item, different bit streams, synthesized by first, second-, and fourth-order (sigma)-(delta) modulators that are programmed by software, are compared for performance. First- and second-order (sigma)-(delta) modulators are implemented on the test chip as the candidates for the analog response extractor. The measurement results by single-tone tests and multitone tests validate the feasibility of the BIST scheme.
Keywords :
Prospective study , waist circumference , Abdominal obesity , Food patterns
Journal title :
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II:ANALOG AND DIGITAL SIGNAL PROCESSING
Journal title :
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II:ANALOG AND DIGITAL SIGNAL PROCESSING
Serial Year :
2003
Link To Document :
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