Record number :
Title of article :
Characterization of copper selenide thin films deposited by chemical bath deposition technique
Author/Authors :
Al-Mamun، نويسنده , , A.B.M.O. Islam، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
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Abstract :
A low-cost chemical bath deposition (CBD) technique has been used for the preparation of Cu2 xSe thin films onto glass substrates and deposited films were characterized by X-ray diffractometry (XRD), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and UV–vis spectrophotometry. Good quality thin films of smooth surface of copper selenide thin films were deposited using sodium selenosulfate as a source of selenide ions. The structural and optical behaviour of the films are discussed in the light of the observed data.
Keywords :
XRD , AFM , CBD , Copper selenide , XPS
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
Link To Document :