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Title of article :
Phase detection method with positive-feedback control using a quartz resonator based atomic force microscope in a liquid environment
Author/Authors :
Ryuji Nishi )، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
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Abstract :
An atomic force microscope (AFM) using a quartz resonator sensor has great potential as a highly sensitive force detection device. An AFM can detect the solvation force in a liquid environment. We used the phase detection method with positive feedback to improve AFM sensitivity. Phase shift curves as a function of distance show oscillations with periods that correspond to the diameter of a molecule placed between the AFM tip and the surface of a sample substrate. These oscillations are due to the solvation forces when the surface of the substrate is compressed with the AFM tip.
Keywords :
quartz , Liquid , Molecule , phase detection , Solvation force , OMCTS , AFM
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
Link To Document :