Record number :
Title of article :
Sample holder assembly covering a wide range of temperatures for surface X-ray diffraction
Author/Authors :
H. Tajiri، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
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Abstract :
We describe a sample holder assembly which can control a sample temperature in a wide range. The assembly is attached to a six-circle surface X-ray diffractometer with an ultrahigh-vacuum chamber. Samples up to 16.5 mm square can be held at constant temperatures between 50 and 1350 K with a tantalum heater on a pyrolytic boron nitride plate and a closed-cycle helium refrigerator. The accuracy of a sample temperature is <1 K in cooling. We have assessed the performance of the assembly by observing the diffraction intensities from a Si(1 1 1)- ffiffiffi 3 p ffiffiffi 3 p -Ag surface.
Keywords :
Surface structure , Reconstructed surface , Silicon , X-ray diffraction
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
Link To Document :