Record number :
Title of article :
Atomic-scale properties of low-index ZnO surfaces
Author/Authors :
Ulrike Diebold، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
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Abstract :
Zinc oxide (ZnO) is an important material in heterogeneous catalysis and has recently attracted interest as a wide band-gap semiconductor for electro-optical devices. The surfaces and interfaces of ZnO are critical for understanding the mechanistics of surface chemical reactions and for the fabrication of high quality hetero- and homoepitaxial films with long-term stability. The surfaces of the main low-index planes, i.e., surfaces with (0 0 0 1), ð00 0 1Þ; ð10 10Þ; ð11 2 0Þ and ð1 1 2 1Þ orientations are characterized with high-resolution scanning tunneling microscopy and compared to first-principles total-energy calculations
Keywords :
Roughness , topography , Scanning tunneling microscopy , Surface structure , zinc oxide , morphology
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
Link To Document :