Record number :
1000197
Title of article :
Secondary electron emission of sapphire and anti-multipactor coatings at high temperature
Author/Authors :
Shinichiro Michizono، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
4
From page :
227
To page :
230
Abstract :
Electrical breakdown (surface discharge) is one of the most serious problems for developing compact and/or higher voltage insulation in a vacuum. Electron multiplication (multipactor) due to high secondary electron emission (SEE) yields from an insulator surface is one of the reasons for the discharge. Multipactor induces not only discharging but also excess surface heating, leading to localized surface melting. Thus, SEE at high temperature is important for understanding the actual breakdown process. The SEE yield of single crystal alumina (sapphire) and anti-multipactor coatings, such as TiN and DLC films having low SEE yields, are measured in a scanning electron microscope (SEM). # 2004 Elsevier B.V. All rights reserved
Keywords :
Sapphire , Anti-multipactor coatings , Secondary electron emission
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
2004
Link To Document :
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