Record number :
Title of article :
Chemistry of green encapsulating molding compounds at interfaces with other materials in electronic devices
Author/Authors :
A. Scandurra، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
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Abstract :
The interface chemistry between encapsulating epoxy phenolic molding compound (EMC) containing phosphorous based organic flame retardant (the so called ‘‘green materials’’) and copper oxide–hydroxide and aluminum oxide–hydroxide surfaces have been studied in comparison with ‘‘conventional’’ EMC containing bromine and antimony as flame retardant. These green materials are designed to reduce the presence of toxic elements in the electronic packages and, consequently, in the environment. For the study were used a Scanning Acoustic Microscopy for delamination measurements, a dynamometer for the pull strength measurements and an ESCA spectrometer for chemical analysis of the interface. The general behavior of the green compound in terms of delamination, adhesion, and corrosion is found better or at least comparable than that of the conventional EMC. # 2004
Keywords :
Delamination , Flame retardant additives , Die surface , Microelectronic package , Green molding compounds , Organic phosphorous
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
Link To Document :