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Title of article :
Surface X-ray diffraction in transmission geometry
Author/Authors :
Hiroo Tajiri، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
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Abstract :
We performed transmission X-ray diffraction (TXD) experiments with a Si(1 1 1) sample and an image plate in air. A large number of crystal truncation rod (CTR) scatterings can be collected all at once in transmission geometry by suppressing thermal diffuse scattering from a bulk. This benefit makes us free from time-consuming measurements in surface X-ray diffraction. In addition, intensities along CTRs were obtained correctly. Further progress in TXD under an ultra-high vacuum condition is also discussed with the results obtained from a Si(1 1 1)-7 7 surface. # 2004 Elsevier B.V. All rights reserved.
Keywords :
Surface structure , Reconstructed surface , X-ray diffraction , Silicon
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
Link To Document :