The tunability of synchrotron radiation is exploited to probe the structural properties of SnPc films deposited on a GaAs(0 0 1)
surface. Soft X-ray photoelectron spectroscopy (SXPS) shows that the organic adlayer is weakly interacting with the surface and
that the growth mode is Stranski–Krastanov. Near edge X-ray absorption fine structure (NEXAFS) shows that the plane of SnPc
molecules in a thick adlayer is close to parallel with the substrate. High photon flux ‘beam damage’ is apparent in an increased
binding energy of the Sn4d core level.
# 2004 Elsevier B.V. All rights reserved
PES , NEXAFS , SXPS , GaAs , Phthalocyanine , SnPc , Beam damage , Organic molecules