Record number :
1000023
Title of article :
The growth of silver films on Si(1 1 1)-(7 × 7) studied by using photoelectron diffraction
Author/Authors :
Perez-Dieste، Virginia نويسنده , , J.F Sanchez، نويسنده , , M Izquierdo، نويسنده , , L Roca، نويسنده , , J Avila، نويسنده , , M.C Asensio، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
9
From page :
235
To page :
243
Abstract :
We have combined synchrotron radiation photoemission (PES), X-ray photoelectron diffraction (PED) and low-energy electron diffraction (LEED) to examine the formation of the Ag/Si(1 1 1)-(7×7) interface, throughout a wide silver coverage range. All studied silver films gave rise to a fcc phase with their principal crystallographic axes parallel to the substrate and a [1 1 1] orientation perpendicular to the surface. Angular-scanned PED of the Ag 4p core level showed the formation of well-ordered Ag islands, with the presence of two well-defined domains, both for 6 and 30 ML films. The two domains were rotated 60° from each other and appeared in a 60/40 proportion.
Keywords :
Silver , Silicon , Metal–semiconductor interfaces , Spectroscopy , Photoemission , Photoelectron diffraction
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
Serial Year :
2003
Link To Document :
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